Skip to main content
PPGEE/UFAM

Trabalho em anais de eventoOpen Access

Map2Check using LLVM and KLEE

MENEZES, R.; Rocha, H.; CORDEIRO, L. C.; BARRETO, R. S

2018 • 24th International Conference on Tools and Algorithms for the Construction and Analysis of Systems • 6 citações

Resumo

Resumo

Map2Check is a bug hunting tool that automatically checks safety properties in C programs. It tracks memory pointers and variable assignments to check user-specified assertions, overflow, and pointer safety. Here, we extend Map2Check to: (i) simplify the program using Clang/LLVM; (ii) perform a path-based symbolic execution using the KLEE tool; and (iii) transform and instrument the code using the LLVM dynamic information flow. The SVCOMP’18 results show that Map2Check can be effective in generating and checking test cases related to memory management of C programs.

palavras-chave

Palavras-chave

bug huntingC programssafety propertiespointer safetyKLEELLVMprogram instrumentationtest case generationmemory managementprogram simplification

Status

Published

links

DOI

10.1007/978-3-319-89963-3_28

Link Externo

https://doi.org/10.1007/978-3-319-89963-3_28

Repositório

https://research.manchester.ac.uk/en/publications/453b8f20-e8c5-4907-a3bb-5e257dd65c96

Trabalho em anais de evento

Leveraging Template Matching for Efficient Android Screenshot Visual InspectionMYRRIA, ABDA; CASTRO, ALICE; MUNIZ, CAIQUE; BARBOSA, HERYCK; SILVA, ANDRÉ; CORDOVIL, LUIZ; PORTY, ROGER; SOUTO, THIAGO2026 • 2026 IEEE International Conference on Consumer Electronics (ICCE)1citações
Comparative Evaluation of DNNs and Template Matching for GUI Validation on Android DevicesMYRRIA, ABDA; CASTRO, ALICE; MUNIZ, CAIQUE; BARBOSA, HERYCK; SILVA, ANDRÉ; CORDOVIL-JR, LUIZ; PORTY, ROGER; SOUTO, THIAGO2026 • 2026 IEEE International Conference on Consumer Electronics (ICCE)
LLM-based text-to-JQL Generation: an automated test using execution and structural indicatorsLIMA, RAYFRAN ROCHA; DE BRITO, IRINEU EVANGELISTA CRUZ; NASCIMENTO, JARDEL DA CUNHA; CORDOVIL-JR, LUIZ2026 • 2026 IEEE International Conference on Consumer Electronics (ICCE)
Bearing fault prognosis based on evolving granular modelsMARTINIANO, ALEXANDRE; VITÓRIO, ANDEVALDO; AYRES, FLORINDO; OTANI, MARIO; MEDEIROS, JOSÉ; NUNES, RIVELINO; SILVA, RENAN; VARELA, JERRY; MOURA, DAVIDSON; SANTOS, KENNY; COSTA, JEFERSON; MENDONÇA, RAFAEL; BESSA, IURY2026 • XX Simpósio Brasileiro de Automação Inteligente (SBAI 2025) e XII Simpósio Brasileiro de Sistemas Elétricos (SBSE 2025)

Ver todas as publicações